The photomask acts as a template for your device, and it must be perfect. One bad die is unacceptable, and even a single defect can be catastrophic when printed. Because of these stringent requirements, we have developed key competencies to improve our manufacturing. We offer our Yield Management Services to help solve your problems.
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Yield problems are expensive, and every day the issue goes unsolved costs you money. Systematic root cause investigation of a yield problem typically includes isolating the individual variables that may be contributing to the excursion. Device-specific interactions, process or tool problems, and batch-to-batch variation are all possible sources of the problem.
At Toppan, we want to help you quickly partition the problem and eliminate root causes. We have a variety of analytical methods that can help you characterize your photomask to bring you one step closer to fixing your yield excursion. Explore the list below to see the extensive techniques we have available.
If you need support with material analysis, please Contact Us to see how we can help!
After decades building masks for hundreds of different customers, we have experience that can help you solve lithography problems. When you're facing an unusual issue, or simply need an extra pair of eyes on a topic, our team of experts is ready to help.
Using industry-leading root-cause analysis coupled together with our Material Analysis and Lithography Simulation Services, we can team-up with your staff to tackle nearly any type of issue. At our disposal is the entire company's suite of inspection and metrology tools, which nearly guarantees that we'll help you get to the bottom of the problem.